Search Result "Metrology"
Metrology and Nanometrology at Agricultural/Food/NutraceuticalInterface: An Updated Shot
Journal: Current Bioactive Compounds
Volume: 19 Issue: 3 Year: 2023 Page: 73-84
Author(s): Eliana B. Souto
Introduction to Strain Metrology for Semiconductors
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Multi-Target Modular probe for Large-Volume Metrology
Journal: Recent Patents on Engineering
Volume: 11 Issue: 0 Year: 2017 Page: 1-9
Author(s): Domenico A. Maisano,Luca Mastrogiacomo
PART 4: EMERGING STRAIN METROLOGY
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
PART 2: OPTICAL STRAIN METROLOGY
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Which Metrological Index, the BASMI or EDASMI, is Best Correlatedwith Disease-Related Parameters in Spondylarthritis Patients?
Journal: Current Rheumatology Reviews
Volume: 18 Issue: 3 Year: 2022 Page: 224-229
Author(s): Dorra Ben Nessib
PART 3: ELECTRON BEAM STRAIN METROLOGY
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Journal: Current Medicinal Chemistry
Volume: 18 Issue: 1 Year: 2011 Page: 2115-2128
Author(s): J.-P. Kaiser, M. Roesslein, T. Buerki-Thurnherr, P. Wick
Strain, Stress and Semiconductor Properties
Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Signal Spectral Analysis
Ebook: Digital Signal Processing in Experimental Research Volume Title: Fast Transform Methods in Digital Signal Processing
Volume: 1 Year: 2011
Author(s): Leonid Yaroslavsky