Metrology and Nanometrology at Agricultural/Food/NutraceuticalInterface: An Updated Shot

Journal: Current Bioactive Compounds
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Introduction to Strain Metrology for Semiconductors

Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010004

Multi-Target Modular probe for Large-Volume Metrology

Journal: Recent Patents on Engineering
Volume: 11 Issue: 0 Year: 2017 Page: 1-9
Author(s): Domenico A. Maisano,Luca Mastrogiacomo

PART 4: EMERGING STRAIN METROLOGY

Ebook: Semiconductor Strain Metrology: Principles and Applications
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Author(s): Terence K.S. Wong
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PART 2: OPTICAL STRAIN METROLOGY

Ebook: Semiconductor Strain Metrology: Principles and Applications
Volume: 1 Year: 2012
Author(s): Terence K.S. Wong
Doi: 10.2174/978160805359911201010027

Which Metrological Index, the BASMI or EDASMI, is Best Correlatedwith Disease-Related Parameters in Spondylarthritis Patients?

Journal: Current Rheumatology Reviews
Volume: 18 Issue: 3 Year: 2022 Page: 224-229
Author(s): Dorra Ben Nessib

PART 3: ELECTRON BEAM STRAIN METROLOGY

Ebook: Semiconductor Strain Metrology: Principles and Applications
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Journal: Current Medicinal Chemistry
Volume: 18 Issue: 1 Year: 2011 Page: 2115-2128
Author(s): J.-P. Kaiser, M. Roesslein, T. Buerki-Thurnherr, P. Wick

Strain, Stress and Semiconductor Properties

Ebook: Semiconductor Strain Metrology: Principles and Applications
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Signal Spectral Analysis

Ebook: Digital Signal Processing in Experimental Research Volume Title: Fast Transform Methods in Digital Signal Processing
Volume: 1 Year: 2011
Author(s): Leonid Yaroslavsky
Doi: 10.2174/978160805230111101010058