Electromagnetic Interference Issues in Power Electronics and Power Systems

Author(s): '> Vuttipon Tarateeraseth, Kye Yak See, Flavio G. Canavero

DOI: 10.2174/978160805240011101010038

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Noise Source Impedance Measurement in SMPS

Pp: 38-56 (19)

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Abstract

SHS investigation development is considered from the geographical and historical viewpoint. 3 stages are described. Within Stage 1 the work was carried out in the Department of the Institute of Chemical Physics in Chernogolovka where the scientific discovery had been made. At Stage 2 the interest to SHS arose in different cities and towns of the former USSR. Within Stage 3 SHS entered the international scene. Now SHS processes and products are being studied in more than 50 countries.

Abstract

An accurate measurement method to extract common mode (CM) and differential mode (DM) noise source impedances of a switched-mode power supply (SMPS) under operating condition is presented in this chapter. With a proper pre-measurement calibration process, the proposed method allows extraction of both the CM and the DM noise source impedances with very good accuracy. These noise source impedances come in handy to systematically design an electromagnetic interference filter for a SMPS with minimum hassle.

Keywords:

Calibration process, CM noise source impedance, Common mode chokes, Common mode inductors, Conducted Electromagnetic Interferences, Conducted emissions, Coupling capacitors, Differential mode chokes, Differential mode inductors, Differential mode noise impedance, Direct clamping two-probe approach, DM noise source impedance, Equivalent series inductance (ESL), Equivalent series resistance (ESR), Hilbert transform, Insertion Loss (IL), Linearization, Load termination impedances, Mutual inductance, Noise coupling mechanism, Noise source impedance measurement, Noise source impedances, Noise termination impedances, Parasitic capacitances, Parasitic inductances, Power line impedances, Reflection coefficient, Reverse-recovery phenomena, RF instruments, RF isolation, Scattering parameters, Sensing probe, Small-signal perturbation, S-parameters, Switched-mode power supplies (SMPS), Vector Network Analyser (VNA), Y-capacitors (Y-caps), X-capacitors (X-caps)

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