Abstract

The chapter is devoted to the surface and structural characterisations of the materials used in photovoltaic applications for the determination of the topographic/morphological and structural properties.

In the first part of the chapter Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM) and X-ray Diffraction (XRD) are illustrated, with particular emphasis on the working principles. In the second part, some examples of application of these techniques to the silicon-based thin films solar cells are described. Recent and important experimental results obtained in these fields are examined and discussed, showing what kind of information they have provided.