Advanced Characterization Technologies for Secondary Batteries

Author(s): Jili Yue*, Chaoxiang Xie, Xingze Jia, Yixiao Li, Mengmeng Qian, Tinglu Song and Chunli Li * .

DOI: 10.2174/9789815305425124010006

Atomic Force Microscopy and its Applications in Secondary Batteries

Pp: 75-96 (22)

Buy Chapters

* (Excluding Mailing and Handling)

  • * (Excluding Mailing and Handling)

Abstract

SHS investigation development is considered from the geographical and historical viewpoint. 3 stages are described. Within Stage 1 the work was carried out in the Department of the Institute of Chemical Physics in Chernogolovka where the scientific discovery had been made. At Stage 2 the interest to SHS arose in different cities and towns of the former USSR. Within Stage 3 SHS entered the international scene. Now SHS processes and products are being studied in more than 50 countries.

Abstract

Atomic Force microscope (AFM) not only reveals the surface morphology of substances at the nanoscale and molecular level but also enables the measurement of extremely weak forces, which allows for the study of weak interactions between molecules. Moreover, the AFM possesses certain spatial resolution ability. As a valuable tool in secondary battery research, AFM could reveal the surface microscopic morphology of the electrode in real time through the interaction between atoms from the tip and the electrode surface. It offers nanoscale surface information of the electrode from both chemical and physical perspectives, thus establishing essential guidance for further modification of electrode materials and electrolytes. This chapter reviews the state-of-art application progress of AFM in the study of secondary batteries, including cathode materials, anode materials and solid electrolyte interface. 

We recommend

Favorable 70-S: Investigation Branching Arrow

Authors:Bentham Science Books