Advanced Characterization Technologies for Secondary Batteries

Author(s): Ni Yang, Yali Li, Lian Wang, Tinglu Song and Yuefeng Su * .

DOI: 10.2174/9789815305425124010005

Focused Ion Beam Methods and its Applications in Secondary Batteries

Pp: 37-74 (38)

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* (Excluding Mailing and Handling)

  • * (Excluding Mailing and Handling)

Abstract

SHS investigation development is considered from the geographical and historical viewpoint. 3 stages are described. Within Stage 1 the work was carried out in the Department of the Institute of Chemical Physics in Chernogolovka where the scientific discovery had been made. At Stage 2 the interest to SHS arose in different cities and towns of the former USSR. Within Stage 3 SHS entered the international scene. Now SHS processes and products are being studied in more than 50 countries.

Abstract

This chapter discusses the major challenges of characterizing the microstructure and morphology of battery materials, as well as the limitations of current characterization techniques in lithium-ion batteries. To address these challenges, the dual-beam system of focused ion beam scanning electron microscopy (FIB-SEM) emerges as one promising solution. The FIB-SEM system enables accurate manipulation and analysis of battery materials from both micro- and nano-scale perspectives, thus providing valuable insights for the development of high-performance and safe lithium-ion batteries.

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