Search Result "Very Large Scale Integration (VLSI)."
Copper Metallization for Current Very Large Scale Integration
Journal: Recent Patents on Nanotechnology
Volume: 5 Issue: 2 Year: 2011 Page: 106-137
Author(s): Q. Jiang, Y. F. Zhu, M. Zhao
A Congestion-based Routing Model and Its Optimization Method for VLSI Routing
Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 11 Issue: 4 Year: 2018 Page: 411-417
Author(s): Xiuhua Chen,Jianli Chen
From Chips to Systems: Exploring Disruptive VLSI Ecosystems
Ebook: A Practitioner's Approach to Problem-Solving using AI
Volume: 1 Year: 2024
Author(s): Owais Ahmad Shah
Doi: 10.2174/9789815305364124010020
Recent Patents on Cu/low-k Dielectrics Interconnects in Integrated Circuits
Journal: Recent Patents on Nanotechnology
Volume: 1 Issue: 3 Year: 2007 Page: 193-209
Author(s): Qing Jiang, Yong F. Zhu, Ming Zhao
Role of Artificial Intelligence in VLSI Design: A Review
Journal: Recent Advances in Computer Science and Communications
Volume: 18 Issue: 1 Year: 2025 Page: 35-47
Author(s):
A Comparative Analysis and Ideas to Reduce Various Leakage Power in Modern VLSI
Ebook: Nanoscale Field Effect Transistors: Emerging Applications
Volume: 1 Year: 2023
Author(s):
Doi: 10.2174/9789815165647123010012
VLSI Implementation and Software Co-Simulation of Digital Image Watermarking with Increased Security
Journal: International Journal of Sensors, Wireless Communications and Control
Volume: 10 Issue: 4 Year: 2020 Page: 634-638
Author(s): Vardhana M.,Anil Kumar Bhat
An Investigation for the Negative-Bias Temperature Instability Aware CMOS Logic
Journal: Micro and Nanosystems
Volume: 13 Issue: 4 Year: 2021 Page: 405-417
Author(s): Kajal,Vijay Kumar Sharma
NBTI Effect Survey for Low Power Systems in Ultra-Nanoregime
Journal: Current Nanoscience
Volume: 20 Issue: 3 Year: 2024 Page: 298-313
Author(s): Vijay Kumar Sharma
Application of Wavelet Transform Circuits for Harmonic Analysis in Power Systems
Journal: Recent Advances in Electrical & Electronic Engineering
Volume: 7 Issue: 2 Year: 2014 Page: 90-97
Author(s): Hongmin Li,Yigang He,Tu Bing