Recent Advances in Electrical & Electronic Engineering

Author(s): Yiwen Long*, Zhen Liu, Chenglin Yang, Xiuyun Zhou and Qianyang Duan

DOI: 10.2174/2352096511666180214122906

Residual Life Prediction of RF Oscillator Under Accelerated Stress Failure Condition

Page: [286 - 290] Pages: 5

  • * (Excluding Mailing and Handling)

Abstract

Background: Crystal oscillator plays a major role in the RF system as the frequency source while often encountered in vibration condition. In order to maintain the normal operation of the system, implementing estimation and prediction is necessary as a strategy based on performance degradation. However, there is little research addressing the issues associated with health status evaluation and Residual Useful Life (RUL) prediction of the RF crystal oscillator.

Methods: This paper proposes a method to assess the health status and the RUL tested in a case study under vibration condition.

Conclusion: Our approach utilizes acceleration sensitivity(AS) as indicator and the M-estimation based optimally-pruned extreme learning machine (M-OPELM) as technology, obtaining ideal predicting results according to the actual RUL.

Keywords: RUL, acceleration sensitivity, RF oscillator, M-OPELM, accelerated stress failure, phase noise.

Graphical Abstract