Abstract
Aims: The present study examines the atomic-scale structures of Graphene Oxide (GO) and
Reduced Graphene Oxide (RGO).
Background: Electron microscopic studies on Sri Lankan vein graphite are considerably less; hence, this
study focuses on the atomic-scale study of Sri Lankan vein graphite, using advanced electron microscopic
techniques.
Objective: The purpose of this research is to utilize the data obtained to explore the multidisciplinary
characteristics of graphene to the maximum prospectively.
Method: We report an atomic-scale study on Sri Lankan vein graphite (purest) derivatives using advanced
electron microscopic techniques, including High-Resolution Transmission Electron Microscope
(HRTEM), Scanning Transmission Electron Microscope (STEM), and Electron Energy Loss Spectroscopy
(EELS). The present study examines the atomic-scale structures of Graphene Oxide (GO) and Reduced
Graphene Oxide (RGO).
Result: The results obtained exhibited an inter-atomic layer distance of 3.54 Å for RGO. The EELS study
performed with the electron dose optimization for GO and RGO distinguished the differences in the C K
edge with the oxygen functionalities. The XPS study confirmed the changes in oxygen functionalities
obtained with EELS.
Conclusion: The advanced electron microscopic techniques and other molecular spectroscopic analysis
techniques allowed us to obtain a comprehensive study on Sri Lankan vein graphene-based structural and
chemical features on an atomic scale.
Keywords:
High-resolution transmission electron microscope, scanning electron microscope, electron energy loss spectroscopy, vein graphite, graphene oxide, reduced graphene oxide.
Graphical Abstract
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